The National Institute for Aviation Research has a new Oxford Instruments X-Max Peltier-cooled Energy Dispersive X-ray Spectroscopy (EDS) detector to improve elemental analysis capabilities. EDS is used to detect and quantify the elemental composition of materials. This detector has a large 50 mm2 detector window and drastically improves the sensitivity, speed and resolution of detection analyses. It is capable of rapid elemental mapping and can detect all elements down to Beryllium. It works in conjunction with a JEOL JSM-6460LV tungsten-filament scanning electron microscope (SEM) and further improves the suite of imaging and inspection capabilities. For SEM imaging and EDS analysis questions, contact Joel White at jwhite@niar.wichita.edu or 978-7969.
